发明名称 Stress mode circuit for an integrated circuit with on-chip voltage down converter.
摘要 A stress mode circuit is provided on an integrated circuit memory to generate a voltage that is either (a) equal to a reference voltage (VREF), or (b) is proportional to an external supply voltage VCCEXT. The circuit includes two voltage divider circuits (60) to provide the proportional voltage. Two differential amplifiers (72, 74, 76, 78, 80, 82; 94, 96, 98, 100, 102, 104) are provided to generate outputs corresponding to a comparison to the proportion voltage and the reference voltage (VREF). The outputs operate switches (52, 64) that couple the reference voltage (VREF) or the proportional voltage to an output terminal. <IMAGE>
申请公布号 EP0600527(A1) 申请公布日期 1994.06.08
申请号 EP19930202713 申请日期 1993.09.18
申请人 UNITED MEMORIES, INC. 发明人 HARDEE, KIM C.;CORDOBA, MICHAEL V.
分类号 G01R31/26;G01R31/28;G05F1/46;G11C11/401;G11C11/407;G11C11/413;G11C29/00;G11C29/06 主分类号 G01R31/26
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