| 摘要 |
An alarm display system for automatic test handling of electric devices such as integrated circuits ("ICs"), semiconductor chips and the like, is capable of notifying and displaying an occurrence of an error or other inadequacies in the automatic test handler, a generic position and a specific position of the error in the test handler. The test handler wherein the alarm display system of the present invention is to be included has improved IC transfer, test sequence and sorting capabilities in order to provide enhanced productivity and reliability for the testing of integrated circuits. The alarm display system is capable of showing an error and its position, and at the same time, when there is no error, controlling and displaying a general procedure of the test handler. The alarm display comprises a controller for controlling a total operational procedure for detecting and displaying an error in the test handler based on signals from various sensors in addition to an over all handling and testing operation, a general purpose display such as a cathode ray tube or a plasma display panel for showing an occurrence of error or erroneous operation in the test handler and a general position and specific position of the error, and a plurality of sensors for monitoring and sensing the movement of the electronic devices to be tested and other parameters such as temperature in a temperature chamber, air pressure in a compressed air system and the like in the test handler.
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