发明名称 Manufacturing method of thin film transistor
摘要 A manufacturing method of a thin film transistor, wherein a laminated body consisting of an intrinsic amorphous silicon layer and a conductive amorphous silicon layer is formed on a glass substrate, and annealed at low temperatures not higher than 600 DEG C. thereby obtaining a polycrystalline silicon film. The conductive amorphous silicon layer gives girth to a core for polycrystallization, and therefore the intrinsic amorphous silicon layer is easily recrystallized by annealing at low temperatures.
申请公布号 US5318919(A) 申请公布日期 1994.06.07
申请号 US19910738201 申请日期 1991.07.30
申请人 SANYO ELECTRIC CO., LTD. 发明人 NOGUCHI, SHIGERU;ISHIDA, SATOSHI;IWATA, HIROSHI;SANO, KEIICHI
分类号 H01L21/20;H01L21/336;H01L29/786;(IPC1-7):H01L29/04;H01L29/784 主分类号 H01L21/20
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