| 摘要 |
PURPOSE:To accurately measure a void when irregularities exist on the filled face in an inspection object by providing an irregular state calculation unit obtaining the counting width via the integration signal from a channel scaler and obtaining the counting rate via the contrast processing in the height direction and a void state display unit displaying the void state signal. CONSTITUTION:A void measuring device is constituted of an A/D converter 6 inputted with the output signal from a gamma-ray detector 4 for A/D conversion, a channel scaler 7 inputted with the output signal to integrate it in response to the gamma-ray orbit scanning, an irregular state calculation unit 8 making the contrast processing in the height direction of an inspection object 1 from its output, and a void state display unit 9. The time series data integrated by the scaler 7 in response to the gamma-ray orbit scanning are obtained. The counting width is obtained by the calculation unit 8 synchronously with the gamma-ray orbit scanning time, and the counting rate proportional to the irregular state of the inspection face of the inspection object 1 is calculated. The void state signal is inputted to the display unit 9 and displayed.
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