发明名称 Method and apparatus for detecting wavelength of laser beam
摘要 A laser light, whose wavelength is to be measured, is introduced into an etalon, a concentric circular interference stripe derived from the etalon is irradiated onto a one-dimensional photodetector array and a diameter of the interference stripe is measured to measure the wavelength of the laser light. Alternatively, if a reference laser light of known wavelength is introduced into the etalon, as described above, a wavelength measurement of extremely high accuracy can be made without being affected by positional deviations of the optical system.
申请公布号 US5319441(A) 申请公布日期 1994.06.07
申请号 US19930114287 申请日期 1993.09.01
申请人 MITSUI PETROCHEMICAL INDUSTRIES, LTD. 发明人 TERADA, MITSUGU;OHMATA, KEN;UEHARA, MICHITO;SHIBATA, HIDEAKI;OEDA, YASUO;TERASHI, YUICHIRO
分类号 G01J3/26;G01J9/02;H01S3/00;(IPC1-7):G01B9/02 主分类号 G01J3/26
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