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发明名称
MOS memory cell with exponentially-profiled doping and offset floating gate tunnel oxidation.
摘要
申请公布号
EP0384275(B1)
申请公布日期
1994.06.01
申请号
EP19900102847
申请日期
1990.02.14
申请人
NATIONAL SEMICONDUCTOR CORPORATION
发明人
ARONOWITZ, SHELDON;FORSYTHE, DONALD D.;WALKER, GEORGE P.;GADEPALLY, BAHSKAR V.S.
分类号
H01L21/8247;H01L27/115;H01L29/10;H01L29/36;H01L29/788;H01L29/792;(IPC1-7):H01L29/788
主分类号
H01L21/8247
代理机构
代理人
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地址
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