发明名称 Self-aligned via.
摘要 A method is provided for a self-aligned via of a semiconductor integrated circuit, and an integrated circuit formed according to the same. A conductive bilayer (26,28) is formed over a conductive structure and a portion of a first underlying interlevel dielectric layer (24). The conductive bilayer (26,28) is then patterned and etched, wherein a pillar (29) is formed at an upper surface of the bilayer (26,28). A second interlevel dielectric layer (30) is formed adjacent to the pillar (29) and over the remaining bilayer (26,28). The pillar (29) forms a conductive material within a self-aligned via. <IMAGE>
申请公布号 EP0599592(A1) 申请公布日期 1994.06.01
申请号 EP19930309313 申请日期 1993.11.23
申请人 SGS-THOMSON MICROELECTRONICS, INC. 发明人 HASLAM, MICHAEL E.;SPINNER, CHARLES R., III.
分类号 H01L21/28;H01L21/3205;H01L21/768;H01L23/52;H01L23/522 主分类号 H01L21/28
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