发明名称 |
Self-aligned via. |
摘要 |
A method is provided for a self-aligned via of a semiconductor integrated circuit, and an integrated circuit formed according to the same. A conductive bilayer (26,28) is formed over a conductive structure and a portion of a first underlying interlevel dielectric layer (24). The conductive bilayer (26,28) is then patterned and etched, wherein a pillar (29) is formed at an upper surface of the bilayer (26,28). A second interlevel dielectric layer (30) is formed adjacent to the pillar (29) and over the remaining bilayer (26,28). The pillar (29) forms a conductive material within a self-aligned via. <IMAGE> |
申请公布号 |
EP0599592(A1) |
申请公布日期 |
1994.06.01 |
申请号 |
EP19930309313 |
申请日期 |
1993.11.23 |
申请人 |
SGS-THOMSON MICROELECTRONICS, INC. |
发明人 |
HASLAM, MICHAEL E.;SPINNER, CHARLES R., III. |
分类号 |
H01L21/28;H01L21/3205;H01L21/768;H01L23/52;H01L23/522 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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