发明名称 QUALITY CONTROL DEVICE
摘要 <p>PURPOSE:To provide data useful for the countermeasure for a user by analyzing the condition of generating quality abnormality. CONSTITUTION:Basing on the measured data of respective 1st, 2nd,..., n-th inspection machines 111, 112,..., 11n, a quality tendency abnormality judging means 18A and an individual quality abnormality judging means 18B judge the generation of quality abnormality, and the item or the like of generated quality abnormality is inputted to an information analyzing means 30. Basing on a command signal or the like from an input means 20, the inputted quality abnormality items are arranged in the descending order of the frequency of inputting or the length of the inspection machine stop time caused by this quality abnormality and displayed on a display means 40 by the information analyzing means 30.</p>
申请公布号 JPH06150098(A) 申请公布日期 1994.05.31
申请号 JP19920295117 申请日期 1992.11.04
申请人 TOYO A TEC KK 发明人 HORIE SHIGENORI;OIWA SHINICHI;SUGA MASAKAZU
分类号 G07C3/14;B65G61/00;G05B19/418;G06Q50/00;G06Q50/04;(IPC1-7):G07C3/14;G06F15/21 主分类号 G07C3/14
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