发明名称 Semiconductor integrated circuit and associated test method
摘要 A semiconductor integrated circuit includes a sequential circuit including a plurality of flip-flops which latch and keep data supplied to an input terminal at a prescribed timing and which perform prescribed sequential treatments of the input data, and a combinational circuit implemented at the input and/or output terminals of the sequential circuit and which performs a prescribed combinational treatment or treatments of the input and/or output data to and/or from the sequential circuit. The semiconductor integrated circuit also includes a data-through circuit operated by an external control signal configured to transfer the data supplied to the input terminal direct to an output terminal of a prescribed flip-flop of the plurality flip-flops constituting the sequential circuit.
申请公布号 US5317205(A) 申请公布日期 1994.05.31
申请号 US19920892196 申请日期 1992.06.02
申请人 NEC CORPORATION 发明人 SATO, FUMIHIKO
分类号 G01R31/28;G01R31/3185;G06F11/22;H03K3/037;(IPC1-7):H03K3/289 主分类号 G01R31/28
代理机构 代理人
主权项
地址