发明名称 Method and apparatus for inspection of open face honeycomb structures
摘要 A method and apparatus for detecting defects in a structure formed of a honeycomb matrix bonded to a support surface including providing a probe body including means defining a fluid passage forming a supply port to an exterior surface of the probe body; connecting a pressurized fluid source to the fluid passage at a location distal from the supply port; placing the supply port in close proximity to a cell of the honeycomb matrix; supplying fluid from the compressed fluid source to the cell via the fluid passage; and monitoring a fluid pressure produced at a portion of the honeycomb matrix adjacent to the supply port to detect disbonds between the honeycomb matrix and support surface.
申请公布号 US5315861(A) 申请公布日期 1994.05.31
申请号 US19920963194 申请日期 1992.10.19
申请人 GENERAL ELECTRIC COMPANY 发明人 EGAN, GEORGE P.;BORNEMAN, KARL L.;JAEGER, DOUGLAS A.
分类号 G01M3/04;G01M3/26;(IPC1-7):G01M3/26 主分类号 G01M3/04
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