Method and apparatus for testing and configuring the width of portions of a memory

摘要

A circuit and a related process are utilized in a computer system for testing and configuring the width of various portions of memory in a memory array. The circuit captures a state of a memory width control signal (MEMCS16) during a test and configuration cycle, retains the state of the MEMCS16 signal for various blocks of memory, and controls the state of the MEMCS16 signal when a memory access to a particular memory block is made. The circuit tests the state of the MEMCS16 signal for various blocks of the system memory map and thereafter configures a memory control register appropriately. The state of the MEMCS16 signal is retained by a latch when a particular 128K region is accessed and a valid address is present on the address lines. The output of the latch is provided as a processor-readable test result in a bit of a control/test register.