发明名称 Method for making a silicon field emission device
摘要 This invention discloses a method for making a silicon field emission device which ensures in the higher electron emission effect at the same voltage required for field emission by shrinking the diameter of a gate aperture to make the field emission structure sharp. The shrinkage effect of the gate aperture of about 42-45% may be achieved in accordance with this invention.
申请公布号 US5316511(A) 申请公布日期 1994.05.31
申请号 US19930025094 申请日期 1993.03.02
申请人 SAMSUNG ELECTRON DEVICES CO., LTD. 发明人 LEE, KANGOK
分类号 H01J1/304;H01J9/02;H01J31/12;(IPC1-7):H01J9/02 主分类号 H01J1/304
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