CRACK GENERATING DEVICE OF LOW TEMPERATURE EXAMINATION PLATE FOR ELECTRON MICROSCOPE,申请号KR19900021708U-传众专利搜索

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发明名称	CRACK GENERATING DEVICE OF LOW TEMPERATURE EXAMINATION PLATE FOR ELECTRON MICROSCOPE
摘要
申请公布号	KR940003537(Y1)	申请公布日期	1994.05.27
申请号	KR19900021708U	申请日期	1990.12.29
申请人	POHANG IRON & STEEL CO., LTD.;KOREA INDUSTRIAL TECHNOLOGY INSTITUTE	发明人	RYU, KIL - YOL;LEE, SONG - HAK;KIM, BYONG - CHON
分类号	G01N1/00;(IPC1-7):G01N1/00	主分类号	G01N1/00
代理机构		代理人
主权项
地址

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