发明名称 Component temp measuring system using microprocessor IC - estimates component temp from temp-dependent electrical parameter of IC device
摘要 The temp. measuring system monitors an electrical parameter of one element of the IC (7) which is dependant on the temp. to allow the component temp to be estimated using the known temp difference between the IC element and the component (1). Pref. the measured electrical parameter comprises the current of an element supplied with a temp-stabilised voltage, or the voltage of an element receiving a temp. stabilised current. The measured temp. difference is processed by an A-D converter and microprocessor and input into a memory in the form of characteristic lines and/or correction values. USE/ADVANTAGE - Measuring temp. of coil instruments or LCDs. Requires min. additional complexity.
申请公布号 DE4239522(A1) 申请公布日期 1994.05.26
申请号 DE19924239522 申请日期 1992.11.25
申请人 VDO ADOLF SCHINDLING AG, 60487 FRANKFURT 发明人 MARTIN, PEDRO, 6200 WIESBADEN
分类号 G01K3/00;(IPC1-7):G01K3/00;G01K1/20 主分类号 G01K3/00
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