发明名称 |
A method of manufacturing a semiconductor device. |
摘要 |
<p>For manufacturing a semiconductor device having a polycrystalline film with large grains and a high crystallized volume fraction on an insulating substrate, a method is suggested which comprises forming a noncrystalline semiconductor layer (102) mainly composed of silicon on an insulating material (101), performing a first thermal treatment for a solid phase recrystallization on said noncrystalline semicondcutor layer, raising the temperature during a certain time to a prescribed temperature higher than a temperature of said first thermal treatment, and performing a second thermal treatment. <IMAGE></p> |
申请公布号 |
EP0598409(A1) |
申请公布日期 |
1994.05.25 |
申请号 |
EP19930118613 |
申请日期 |
1990.02.12 |
申请人 |
SEIKO EPSON CORPORATION |
发明人 |
OKA, HIDEAKI, C/O SEIKO EPSON CORPORATION;TAKENAKA, SATOSHI, C/O SEIKO EPSON CORPORATION;KUNII, MASAFUMI, C/O SEIKO EPSON CORPORATION |
分类号 |
H01L21/20;H01L21/336;H01L29/49;H01L29/786;(IPC1-7):H01L21/336;H01L21/203;H01L21/316 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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