发明名称 A method of manufacturing a semiconductor device.
摘要 <p>For manufacturing a semiconductor device having a polycrystalline film with large grains and a high crystallized volume fraction on an insulating substrate, a method is suggested which comprises forming a noncrystalline semiconductor layer (102) mainly composed of silicon on an insulating material (101), performing a first thermal treatment for a solid phase recrystallization on said noncrystalline semicondcutor layer, raising the temperature during a certain time to a prescribed temperature higher than a temperature of said first thermal treatment, and performing a second thermal treatment. &lt;IMAGE&gt;</p>
申请公布号 EP0598409(A1) 申请公布日期 1994.05.25
申请号 EP19930118613 申请日期 1990.02.12
申请人 SEIKO EPSON CORPORATION 发明人 OKA, HIDEAKI, C/O SEIKO EPSON CORPORATION;TAKENAKA, SATOSHI, C/O SEIKO EPSON CORPORATION;KUNII, MASAFUMI, C/O SEIKO EPSON CORPORATION
分类号 H01L21/20;H01L21/336;H01L29/49;H01L29/786;(IPC1-7):H01L21/336;H01L21/203;H01L21/316 主分类号 H01L21/20
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