发明名称 Semiconductor device having a polysilicon capacitor with large grain diameter
摘要 A semiconductor device includes a capacitor with an insulator having an improved durability. In the semiconductor device, a capacitor lower electrode 11 of the cylindrical capacitor includes a standing wall portion 11b which is formed of a polysilicon layer having a large crystal grain diameter (1000 ANGSTROM -10000 ANGSTROM ).
申请公布号 US5315140(A) 申请公布日期 1994.05.24
申请号 US19930008020 申请日期 1993.01.22
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 SUGAHARA, KAZUYUKI;ARIMA, HIDEAKI
分类号 H01L27/04;H01L21/02;H01L21/822;H01L21/8242;H01L27/10;H01L27/108;H01L29/16;H01L29/94;(IPC1-7):H01L29/94 主分类号 H01L27/04
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