| 摘要 |
<p>PURPOSE:To provide a memory card device capable of easily inspecting a loading defect such as a soldering defect on a semiconductor memory chip even if a defect saving function is included. CONSTITUTION:In the memory card device provided with a saving means 17 for substituting addresses to be supplied to built-in semiconductor memories 13 to 16 so as to divide all the storage areas of the memories 13 to 16 into plural reference areas with fixed capacity and write data to be written in a reference area generating a writing defect in another normal reference area to save the data, inspection data are previously written in respective reference areas of the memories 13 to 16 at the time of inspecting data reading/writing from/in the memories 13 to 16 prior to their loading.</p> |
