发明名称 ISOLATION METHOD FOR COMPONENTS OF SEMICONDUCTOR
摘要 forming an oxide on a semiconductor substrate; forming polysilicon layers of a multi-layered structure, each layer having a different grain size; forming a nitride layer, and etching the nitride layer selectively so as to expose a isolation region of the substrate, and forming a field oxide on the isolation region to thereby forming the uniform interface of active region and field region.
申请公布号 KR940004253(B1) 申请公布日期 1994.05.19
申请号 KR19910009538 申请日期 1991.06.10
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, YUN - KI;BAN, CHON - SU;KIM, BYONG - RYOL;SON, YONG - BIN
分类号 H01L21/76;(IPC1-7):H01L21/76 主分类号 H01L21/76
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