发明名称 VACUUM SUCTION STAGE
摘要 <p>PURPOSE:To provide a vacuum suction stage which is able to chuck a wafer, wherein the outer peripheral part of the wafer is hardly warped. CONSTITUTION:A quartz suction stage 1 which vacuum-chucks a semiconductor wafer or a glass substrate is provided, a continuous vertical wall 7 as high as prescribed is provided to the peripheral edge of the stage 1, vertical projections 5 large in outer diameter are provided onto the upside of the stage 1 surrounded by the vertical wall 7, surrounding vertical projections 3 small in outer diameter and provided onto the stage 1, and the vertical wall 7 and the projections 3 and 5 are all set equal in height.</p>
申请公布号 JPH06132387(A) 申请公布日期 1994.05.13
申请号 JP19920305970 申请日期 1992.10.19
申请人 HITACHI ELECTRON ENG CO LTD 发明人 TAKEDA KAZUHISA
分类号 B23Q3/08;G01N21/84;G01N21/88;G01N21/956;G12B5/00;H01L21/66;H01L21/68;H01L21/683;(IPC1-7):H01L21/68 主分类号 B23Q3/08
代理机构 代理人
主权项
地址