发明名称 ACTIVE MATRIX SUBSTRATE
摘要 <p>PURPOSE:To enable electric measurement and inspection during production process by providing a resistant body for connecting a short ring between gate signal wires to a short ring between source signal wires. CONSTITUTION:Multiple gate signal wires 2 and multiple source signal wires 3 at right angle to the gate signal wires are formed on an insulating substrate. A thin film transistor 4, a picture element electrode 5, and a storage capacitor 6 are provided in areas surrounded by the wires 2 and 3. A short ring 8 between the gate signal wires is connected to the short ring 9 between the source signal wires through a resistance body 10. Also a short ring 11 between the storage capacitor wires is connected to the short ring 9 between the source signal wires through a resistance body 12. By this, different voltages can be applied to the short rings 8, 9, and 11, respectively, to make a short inspection between the wires and characteristic inspection for active element during production process.</p>
申请公布号 JPH06130419(A) 申请公布日期 1994.05.13
申请号 JP19920283295 申请日期 1992.10.21
申请人 SHARP CORP 发明人 OKAMOTO MASAYA;FUJINO HIRONOBU;HOTTA KOJI;YOSHII MASAHARU
分类号 G02F1/13;G02F1/1345;G02F1/136;G02F1/1368;(IPC1-7):G02F1/136;G02F1/134 主分类号 G02F1/13
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