发明名称 PATTERN FORMING METHOD
摘要 <p>PURPOSE:To manufacture the semiconductor, etc., consisting of a fine pattern which cannot be manufactured easily by the optical lithography technology with a high throughput and accurately. CONSTITUTION:A pattern which is four times larger than that on a wafer is drawn by an electron beam drawing device 21 for creating a reticle 1. a working reticle 2-1 is created using an optical stepper 22 with a reduction factor of 1/2 from the reticle 1, and a stencil mask 5-1 which is created by the working reticle 2-1 is set to an electron beam reduction transfer device 23 with a reduction factor of 1/2 and then a pattern is transferred onto a wafer 7-1.</p>
申请公布号 JPH06132206(A) 申请公布日期 1994.05.13
申请号 JP19920278264 申请日期 1992.10.16
申请人 NIKON CORP 发明人 NAKASUJI MAMORU
分类号 G03F1/20;G03F1/68;G03F1/80;G03F7/20;H01L21/027;H01L21/30;(IPC1-7):H01L21/027;G03F1/08 主分类号 G03F1/20
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