发明名称 FLASH MEMORY
摘要 <p>PURPOSE:To enable performing erasing in which erasing verification time is shortened, a time required to erase can be shortened, while a cell transistor overly erased does not occur. CONSTITUTION:Reference voltage Vref is assumed as 'the lowest limit threshold allowed to VCC-cell transistors 1100-1122'. And word lines WL0-WL2 and a source lines SL are made VCC, nMOS transistors 120-122 and 29 are made an ON state (gate voltage =VCC + Vth - n), erasing verification is performed by comparing a voltage value of a data bus 13 with a voltage value of the reference voltage Vref.</p>
申请公布号 JPH06124595(A) 申请公布日期 1994.05.06
申请号 JP19920274355 申请日期 1992.10.13
申请人 FUJITSU LTD 发明人 RYU YASUSHI
分类号 G11C17/00;G11C16/02;G11C16/06;(IPC1-7):G11C16/06 主分类号 G11C17/00
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