发明名称 Method of diffusing impurities into sidewalls of semiconductor structures from a doped SOG layer.
摘要 A substrate (12) is processed to form raised portions or pedestals (18-24), having sidewalls (26-38), and trenches. A first layer (14,62) either a doped spin on glass (SOG) layer (62) or undoped oxide (14) layer, may be deposited onto the substrate adjacent the sidewalls. The first layer (14,62) is densified. A second layer (16) may be deposited on the first layer (14,62). The second layer is a doped SOG layer (16). The second layer (16) is densified and the substrate (12) is heated to drive dopant into the sidewalls (26-38). <IMAGE>
申请公布号 EP0595481(A1) 申请公布日期 1994.05.04
申请号 EP19930307820 申请日期 1993.10.01
申请人 NCR INTERNATIONAL INC. 发明人 ALLMAN, DERRYL DWAYNE JOHN;MILLER, GAYLE WILBURN
分类号 H01L21/225;H01L21/316;H01L21/334;H01L21/335 主分类号 H01L21/225
代理机构 代理人
主权项
地址