发明名称 Selective sidewall diffusion process using doped SOG
摘要 A selective sidewall diffusion process using doped SOG. A substrate is processed to form raised portions or pedestals, having sidewalls, and trenches. A first layer, either a doped SOG layer or undoped oxide layer, may be deposited onto the substrate adjacent the sidewalls. The first layer is densified. A second layer may be deposited on the first layer. The second layer is a doped SOG layer. The second layer is densified and the dopant is driven into the sidewalls to form shallow junctions.
申请公布号 US5308790(A) 申请公布日期 1994.05.03
申请号 US19920961967 申请日期 1992.10.16
申请人 NCR CORPORATION 发明人 ALLMAN, DERRYL D. J.;MILLER, GAYLE W.
分类号 H01L21/225;H01L21/316;H01L21/334;H01L21/335;(IPC1-7):H01L21/225 主分类号 H01L21/225
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