STAMPER DEFECT INSPECTING DEVICE,申请号JP19920263748-传众专利搜索

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发明名称	STAMPER DEFECT INSPECTING DEVICE
摘要
申请公布号	JPH06118004(A)	申请公布日期	1994.04.28
申请号	JP19920263748	申请日期	1992.10.01
申请人	RICOH CO LTD	发明人	ITO YUJI
分类号	G01B11/30;G01N21/88;G01N21/952;G11B7/26;(IPC1-7):G01N21/88	主分类号	G01B11/30
代理机构		代理人
主权项
地址

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