| 摘要 |
PURPOSE:To provide a lead frame as well as a measurement jig with the lead frame used for continuously measuring high-frequency characteristics in a microwave FET. CONSTITUTION:Microwave devices D1 to DN are put together with a frame 60 and carried in an X-axis direction. When these microwave devices are mounted on a jig 80, the device D2 to be measured is put in a measurement recessed part 90 in such a way that a source lead 67 thereof is put in a source fitting groove 99, while drain and gate leads 68 and 69 are put in drain and gate fitting grooves 101 and 100 for measuring pins 87 and 89. Then, the device D3 to be measured secondly is put in a waiting-state recessed part 91 in a way that a source lead 67 thereof is put in a source fitting groove 99, while drain and gate leads 68 and 69 are put in waiting-state drain and gate fitting grooves 96 and 95. After the measurement, the device D3 is set in a finished- state recessed part 91 in a way that the source lead 67 thereof is put in the fitting groove 99, while drain and gate leads 68 and 69 are put in finished-state drain and gate fitting grooves 96 and 95. |
