发明名称 METHOD FOR WRITING-IN AND ERASING DATA OF SEMICONDUCTOR NON-VOLATILE MEMORY
摘要 <p>PURPOSE:To provide the data writing-in and erasing method of the semiconductor non-volatile memory operable in low power supply with high rewiritable frequency by a method wherein the data writing and erasing method requiring of less current and hardly deteriorating a gate oxide film is to be adopted. CONSTITUTION:In the writing-in method of semiconductor nonvolatile memory provided with a floating gate 13 and a control gate 15 as well as a sidewall type select gate 18 through the intermediary of an insulating film 17 on one side furthermore a pair of diffused layers 19, 20 respectively filling the roles of a drain and a source, the control gate 15 is impressed with the potential capable of forming a channel between the pair of diffused layers 19, 20 as well as the sidewall type select gate 18 with the potential capable of blocking the channel formation. In such a constitution, the floating gate 13 is impressed with a charge to perform the data writing-in step without feeding the pair of diffused layers 19, 20 with any current at all.</p>
申请公布号 JPH06120515(A) 申请公布日期 1994.04.28
申请号 JP19920271379 申请日期 1992.10.09
申请人 OKI ELECTRIC IND CO LTD 发明人 ONO TAKASHI
分类号 G11C17/00;G11C16/04;H01L21/8247;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L29/788;G11C16/02 主分类号 G11C17/00
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