发明名称 ETCHING MASK AND FINE MACHINING METHOD
摘要 PURPOSE:To make it possible to form a quantum fine wire or a quantum box proximately at an interval of a specific dimension. CONSTITUTION:Using an etching mask 4 having a structure in which GaAs layers 2 and AlGaAs layers 3 having a fine wire shape are alternately arranged, a quantum fine wire is formed by etching a machined substrate in which an epitaxial growth of a GaAs layer 6 is performed on an AlGaAs substrate 5. When forming a quantum box, the above method is repeated two times in mutually normal directions.
申请公布号 JPH06120179(A) 申请公布日期 1994.04.28
申请号 JP19920285340 申请日期 1992.09.30
申请人 SONY CORP 发明人 UGAJIN RYUICHI
分类号 H01L21/302;H01L21/3065;H01L29/06;(IPC1-7):H01L21/302 主分类号 H01L21/302
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