发明名称 SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE:To obtain a semiconductor device enabling prevention of occurrence of a crack or peeling of a semiconductor element and a passive component and improvement of reliability thereof, by relaxing a stress acting on a lead frame when a tie bar part of the lead frame is cut. CONSTITUTION:A lead frame 1 is so formed that its inner leads 1b are thicker than outer leads 1c. A transistor element 2 and a semiconductor element 3 are die-bonded on a transistor element mounting part 1a and the inner lead 1b of the lead frame 1 respectively and wire-bonded to desired inner leads 1b by gold wires 7. A chip resistor 4 is connected between desired inner leads 1b with solder 6. Molding is made with sealing resin in this state and thereafter a tie bar part 5 is cut.</p>
申请公布号 JPH06120407(A) 申请公布日期 1994.04.28
申请号 JP19920265798 申请日期 1992.10.05
申请人 MITSUBISHI ELECTRIC CORP 发明人 FUKUBA YOSHIHIRO;KATO HAJIME
分类号 H01L23/50;H01L25/00;(IPC1-7):H01L23/50 主分类号 H01L23/50
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