| 摘要 |
An improved method and apparatus for easily and accurately aligning confocal tandem scanning reflected light microscopes having scanning disc hole diameters as small as 20 microns are described. The method involves the observation and analysis of Moire and other patterns of light occurring within the microscope, and using the apparatus to make very sensitive adjustments that result in a fully aligned, rugged, and stable confocal tandem scanning reflected light microscope offering improved resolution, contrast, and optical slicing capability.
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