| 摘要 |
A loader and unloader is disclosed which is utilized in conjunction with an automatic test machine for handling electric devices such as integrated circuits ("ICs"), semiconductor chips, and the like. The loader handles trays containing a number of ICs to be tested and transfers them to a location on the handler where the ICs can be accurately and quickly removed from the trays for testing. Following the testing, the unloader of the present invention handles the trays which receive the ICs in accordance with various sort categories depending upon the test results. The present invention also encompasses a dual receptacle transfer arm which shuttles IC trays between and among the various components of the loader and unloader. These components are configured so as to minimize travel distance and handling time, thereby increasing the productivity of an automatic test handler into which the present loader and unloader may be incorporated.
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