SEMICONDUCTOR MEASUREMENT DEVICE WITH PROBE CARD,申请号JP19920283628-传众专利搜索

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发明名称	SEMICONDUCTOR MEASUREMENT DEVICE WITH PROBE CARD
摘要
申请公布号	JPH06109764(A)	申请公布日期	1994.04.22
申请号	JP19920283628	申请日期	1992.09.30
申请人	SONY CORP	发明人	YAMAGISHI HIROAKI
分类号	G01R1/073;H01L21/66;(IPC1-7):G01R1/073	主分类号	G01R1/073
代理机构		代理人
主权项
地址

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