发明名称 METHOD FOR FORMING ELECTRODE OF SEMICONDUCTOR ELEMENT
摘要 PURPOSE:To provide a method by which the electrode of a semiconductor light emitting element can be formed so that the electrode can maintain high reliability for a long period. CONSTITUTION:In the title method in which an electrode is formed by successively depositing a contact film 11, barrier film 12, and Au film 10 on a semiconductor element constituted by forming a current blocking layer 2 having a current constricting window and made of a semiconductor and insulating film 1 with a current constricting window having a larger window area than the layer 2 does, the Au film 10 is formed after the contact film 11 and barrier film 12 are successively formed and the films 11 and 12 are subjected to heat treatment.
申请公布号 JPH06112532(A) 申请公布日期 1994.04.22
申请号 JP19920280639 申请日期 1992.09.25
申请人 FURUKAWA ELECTRIC CO LTD:THE 发明人 OGAMINO TAKESHI;AIDA HIROYUKI;SHIBATA MITSUYOSHI
分类号 H01L21/28;H01L33/14;H01L33/30;H01L33/40;H01L33/44 主分类号 H01L21/28
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