发明名称 |
METHOD FOR FORMING ELECTRODE OF SEMICONDUCTOR ELEMENT |
摘要 |
PURPOSE:To provide a method by which the electrode of a semiconductor light emitting element can be formed so that the electrode can maintain high reliability for a long period. CONSTITUTION:In the title method in which an electrode is formed by successively depositing a contact film 11, barrier film 12, and Au film 10 on a semiconductor element constituted by forming a current blocking layer 2 having a current constricting window and made of a semiconductor and insulating film 1 with a current constricting window having a larger window area than the layer 2 does, the Au film 10 is formed after the contact film 11 and barrier film 12 are successively formed and the films 11 and 12 are subjected to heat treatment. |
申请公布号 |
JPH06112532(A) |
申请公布日期 |
1994.04.22 |
申请号 |
JP19920280639 |
申请日期 |
1992.09.25 |
申请人 |
FURUKAWA ELECTRIC CO LTD:THE |
发明人 |
OGAMINO TAKESHI;AIDA HIROYUKI;SHIBATA MITSUYOSHI |
分类号 |
H01L21/28;H01L33/14;H01L33/30;H01L33/40;H01L33/44 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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