MIXED SIGNAL IC TEST CIRCUIT,申请号KR1019910002474-传众专利搜索

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发明名称	MIXED SIGNAL IC TEST CIRCUIT
摘要
申请公布号	KR1019940003415(B1)	申请公布日期	1994.04.22
申请号	KR1019910002474	申请日期	1991.02.13
申请人		发明人
分类号		主分类号
代理机构		代理人
主权项
地址

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