Musterkonturen in Bildverarbeitung.

摘要

Method and apparatus for extracting contour lines from a pattern obtained in image processing, which makes it possible to obtain contour lines real-time with a high speed and, moreover, can easily make use of hardware. In embodiments of the invention a simplified discrimination method for selecting those pixels which form the pattern contour is employed. Pixels are grouped into two groups, X-axis and Y-axis groups or, in other words, given two representations, an X-axis representation and a Y-axis representation. In relation to each group or representation the magnitude of gray level gradient of each pixel is compared with those of neighbouring pixels lying in either X-axis directions or Y-axis directions with respect to the pixel under consideration, and the pixel which has the maximum magnitude of gray level gradient among neighbouring pixels is discriminated. This discrimination method is simple and can offer remarkable improved processing. When contour lines determined for the two groups are combined, pattern contours can be easily obtained.