发明名称 Method for forming a dielectric thin film or its pattern of high accuracy on substrate
摘要 A method and apparatus for forming a dielectric thin film or pattern thereof is provided in which a positive or negative resist of a desired pattern is formed on various substrates including a semiconductor substrate by contact of the resist with a liquefied gas or super critical fluid of CO2, NH3 or the like. Alternatively, a thin film of an organic or inorganic compound dissolved or dispersed in an organic solvent which has been formed on substrate becomes substantially free of any organic matter or functional groups by contact with the liquefied gas or super critical fluid. Semiconductor devices of high performance and high reliability are ensured.
申请公布号 US5304515(A) 申请公布日期 1994.04.19
申请号 US19920925675 申请日期 1992.08.07
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 MORITA, KIYOYUKI;ISHIHARA, TAKESHI
分类号 B08B7/00;G03F7/16;G03F7/32;H01L21/027;H01L21/3105;H01L21/311;H01L21/316;H01L21/768;(IPC1-7):H01L21/469 主分类号 B08B7/00
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