发明名称 DETECTION OF DEFECTS IN GLASS
摘要 <p>Stress-inducing inclusions and other defects in tempered plate glass windows are detected on site by viewing the glass in cross-polarised light. A window (12) is illuminated by a light box (10) through a polariser (11), and the window (12) is viewed through an analyser (14) using either transmitted or reflected light. Despite the light patterns formed by the stresses inherent in tempered glass, small inclusions can be detected by their characteristic stress patterns. Defects in the window glass (12) can be examined in detail on site using a microscope (30) mounted on mounting means (40) releasably attached to the window by suction pads (44). An inclusion can be inspected, and photographed using a camera (33) fitted to a projector lens (32) on the microscope (30). The depth of the inclusion in the glass can be measured using a Vernier scale (34) on the microscope focussing mechanism (37).</p>
申请公布号 WO1994008229(A1) 申请公布日期 1994.04.14
申请号 AU1993000498 申请日期 1993.09.29
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