发明名称 Particle beam surface analyzer
摘要 In a particle beam surface analyzer, having a partition wall separation a vacuum space, an opening that is provided in a partition wall through which the particle beam is taken out, a seal member which is moved along a seal surface of the seal member and seals the opening, a condenser lens which converges the particle beam onto the sample, and detector for detecting a physical quantity from the sample when the particle beam is irradiated on the sample, the surface analyzer further has a movable shift member that pushes one side surface of the seal member along the seal surface of the seal member and a stopping member which the other side surface of the seal member having a predetermined angle being larger than 55 DEG and smaller than 75 DEG to the seal surface is abutted so as to move the seal member along the other side surface till the seal member reaches the openings, whereby resultant forces between the seal member and the seal surface in the side of the one side surface is equal to that in the side of the other side surface. As the predetermined angle is larger than 55 DEG and smaller than 75 DEG to the seal surface, the abrasion and seizure of the seal member are prevented and the contamination of the sample is lessened.
申请公布号 GB2235087(B) 申请公布日期 1994.04.13
申请号 GB19900013216 申请日期 1990.06.13
申请人 * HITACHI, LTD. 发明人 EIICHI * HAZAKI;TADASHI * OTAKA;MINORU * SHIMIZU
分类号 F16K3/18;H01J37/18;(IPC1-7):H01J3/18 主分类号 F16K3/18
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