Interfermeter comprising an integrated arrangement and a reflecting part which are separated from each other by a measurement zone.

摘要

Interferometer comprising an integrated arrangement (42) and a reflecting part (44) separated from this integrated arrangement by a measurement zone (46). This interferometer is characterised in that the measurement light beam (48) and the reference light beam (50) pass through the said measurement zone and are reflected by the said reflecting part, the optical paths of these two beams in the said integrated arrangement being substantially equal. <IMAGE>