发明名称 WAFER POLISHING DEVICE
摘要 PURPOSE:To polish a wafer finished in its polished surface to high flatness further with uniformity over a total surface. CONSTITUTION:A device is provided with a conveying mechanism 4 wherein an upper surface plate 6 for rotating a top ring through a universal joint is conveyed to run to a polishing position by a linear guide after sucking a wafer W and to a pre-washing mechanism 9 after polishing, to detach the wafer W. A liquid flow path opened to an upper surface is formed in the inside of a lower surface plate, and a polishing cloth is fixed to the upper surface through a foaming resin-made sheet of 0.5 to 3mm thickness having many communication blow holes, to provide a cooling water supply means for circulating cooling water from the outside. A vacuum path opened to a lower surface is formed in the inside of the upper surface plate, to fix a flat plate-shaped ceramics chuck, having many through holes, to the lower surface, and further a washing means of a back pad for holding the wafer W by the back pad is provided.
申请公布号 JPH0699348(A) 申请公布日期 1994.04.12
申请号 JP19920250125 申请日期 1992.09.18
申请人 MITSUBISHI MATERIALS CORP;MITSUBISHI MATERIALS SHILICON CORP 发明人 TSUTSUMI YUKIO;KUMABE SHIGEO;TAKAHASHI KEISUKE
分类号 H01L21/304;B24B37/04;B24B37/10;B24B37/30;B24B37/34 主分类号 H01L21/304
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