发明名称 Verfahren zum Montieren eines Silizium-Würfels.
摘要 A process for bonding silicon die (10) to a package. This process comprises the following steps: (a) providing to the back surface of the die (12) an adhesion layer (14) of material which exhibits superior adhesion to both the silicon die and a subsequently applied barrier layer (16); (b) providing to the adhesion layer (14) a barrier layer (16) which is impervious to silicon; (c) providing to the barrier layer (16) a bonding layer (18); and (d) bonding the die to the package by activating a binder composition disposed at the interface of the package and the bonding layer. The barrier layer prevents the migration of silicon to the bonding layer, both at the time of application of the bonding layer to the die and at the time of bonding the die to the package. The adhesion layer enhances the adhesion of the barrier layer material to the back surface of the die. Titanium is the preferred adhesion layer material while tungsten is the preferred barrier layer material. The bonding layer preferably comprises gold while the preferred binder composition is a gold-tin alloy solder. The enhanced adhesion of the barrier layer which prevents silicon migration into the gold produces highly reliable bonds. In another embodiment, a stress relief layer is interposed between the adhesion layer and the back of the silicon die. The material of the stress relief layer is alloyed to the silicon at the back surface of the die which relieves stresses in the die and enhances the planarity of the back surface. This produces bonds which exhibit superior electrical and thermal contact characteristics.
申请公布号 DE3789172(D1) 申请公布日期 1994.04.07
申请号 DE19873789172 申请日期 1987.06.11
申请人 FAIRCHILD SEMICONDUCTOR CORP., CUPERTINO, CALIF., US 发明人 LAWLER, HARLAN, MILPITAS CALIFORNIA 95035, US;PHY, WILLIAM S., LOS ALTOS HILL CALIFORNIA 94022, US
分类号 H01L21/52;H01L21/58;H01L21/60;H01L23/482;H01L23/488;(IPC1-7):H01L21/60 主分类号 H01L21/52
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