发明名称 Measuring profile section, esp. width and height - evaluating profile section contours from detected light reflected during successive illuminations
摘要 The profile section (1) is successively illuminated by a number of light sources (3), and the reflections are detected by a camera. Each illumination by the camera results in a number of data sets contg. information about the contours of the profile section and shadows. The profile is identified from the contours of the first dimension, i.e. the width, and the contours of the shadows of the second dimension, i.e. the height. The data sets are combined into a unit by an algorithm in a computer to enable profile detection. USE/ADVANTAGE - For many applications involving measurement of multidimensional bodies. Increased accuracy.
申请公布号 DE4233384(A1) 申请公布日期 1994.04.07
申请号 DE19924233384 申请日期 1992.10.05
申请人 CONTRAVES GMBH, 78333 STOCKACH, DE 发明人 KENSY, KONRAD, 7204 WURMLINGEN, DE
分类号 G01B11/02;G01C11/02;(IPC1-7):G01B11/24;G01C7/00 主分类号 G01B11/02
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