发明名称 Seal testing, esp. for flat seals - detecting changes in electrical characteristics caused by defects using point or small area probe in electrical circuit
摘要 An electrical circuit is used to test the tightness of a seal. The circuit contains a voltage source (5) whose reference potential is the potential on the rear face of the electrically conducting medium (2). A measurement device (4) and a probe are also included in the circuit. The probe is applied to a point or small area of the open surface of the medium. The effect is a variation in the electrical characteristics of the seal if there is a defect in the test region of the probe. This is detected as a significant change in an at least one electrical parameter. USE/ADVANTAGE- Esp. for testing non-conducting flat seals, e.g. on liquid tanks and in tunnels. Installed seals can be tested in situ before tank or tunnel is filled or becomes operational.
申请公布号 DE4231896(A1) 申请公布日期 1994.03.24
申请号 DE19924231896 申请日期 1992.09.19
申请人 ROEDEL, ANDREAS, DIPL.-ING., 14052 BERLIN, DE 发明人 ROEDEL, ANDREAS, DIPL.-ING., 14052 BERLIN, DE
分类号 E02D19/18;G01M3/40;(IPC1-7):G01M3/40;B65D90/50;E02B3/16 主分类号 E02D19/18
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