发明名称 |
Seal testing, esp. for flat seals - detecting changes in electrical characteristics caused by defects using point or small area probe in electrical circuit |
摘要 |
An electrical circuit is used to test the tightness of a seal. The circuit contains a voltage source (5) whose reference potential is the potential on the rear face of the electrically conducting medium (2). A measurement device (4) and a probe are also included in the circuit. The probe is applied to a point or small area of the open surface of the medium. The effect is a variation in the electrical characteristics of the seal if there is a defect in the test region of the probe. This is detected as a significant change in an at least one electrical parameter. USE/ADVANTAGE- Esp. for testing non-conducting flat seals, e.g. on liquid tanks and in tunnels. Installed seals can be tested in situ before tank or tunnel is filled or becomes operational.
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申请公布号 |
DE4231896(A1) |
申请公布日期 |
1994.03.24 |
申请号 |
DE19924231896 |
申请日期 |
1992.09.19 |
申请人 |
ROEDEL, ANDREAS, DIPL.-ING., 14052 BERLIN, DE |
发明人 |
ROEDEL, ANDREAS, DIPL.-ING., 14052 BERLIN, DE |
分类号 |
E02D19/18;G01M3/40;(IPC1-7):G01M3/40;B65D90/50;E02B3/16 |
主分类号 |
E02D19/18 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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