发明名称 |
Method of making thin film transistors. |
摘要 |
<p>A thin film transistor is formed by depositing amorphous silicon (5,7) on an insulating substrate (1), forming a gate structure (11,13) including oxide (11) in the form of one or more oxide layers (113,115) contacting the silicon and a conducting region (13) separated from the silicon by the oxide, and then using a high-pressure oxidation to form an additional oxide layer (111) between the conducting region and the silicon, thus providing a high-quality gate oxide that has a layered structure. <IMAGE></p> |
申请公布号 |
EP0588487(A2) |
申请公布日期 |
1994.03.23 |
申请号 |
EP19930306357 |
申请日期 |
1993.08.11 |
申请人 |
AMERICAN TELEPHONE AND TELEGRAPH COMPANY |
发明人 |
CHEN, MIN-LIANG, SCIENCE-BASED INDUSTRIAL PARK;PRADIP, KUMAR ROY |
分类号 |
H01L29/78;H01L21/336;H01L29/49;H01L29/786;(IPC1-7):H01L21/336;H01L29/784;H01L21/28 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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