发明名称 METHOD AND CIRCUIT FOR PERFORMING COMBINATION TEST ON CIRCUIT BREAKER
摘要 <p>PURPOSE:To obtain a method and circuit for performing a combination test with high equivalence without causing excess stress. CONSTITUTION:A voltage source transformer 11 is inserted into the first interruption phase of an auxiliary breaker 4 similarly to second and third cut-off phases and an isolation switch 12 is inserted between the first cut-off phase of a sample circuit breaker 3 and a voltage source circuit 2. In such constitution, a transient recovery voltage appears immediately after cut-off of voltage source current but since the isolation switch 12 isolates the voltage source circuit 2, an AC voltage is applied from the voltage source transformer 11 onto the cut-off phase of the sample circuit breaker 3. This constitution suppresses voltage rise with respect to other phase.</p>
申请公布号 JPH0682536(A) 申请公布日期 1994.03.22
申请号 JP19920234860 申请日期 1992.09.02
申请人 MEIDENSHA CORP 发明人 ONOMOTO SHIYUUJI;MATSUNAMI TAKAKAZU;SHIOZAKI MITSUYASU;ARAKAWA SHUNICHI;CHIYOU TERUMICHI
分类号 G01R31/327;G01R31/333;(IPC1-7):G01R31/32 主分类号 G01R31/327
代理机构 代理人
主权项
地址