| 摘要 |
An apparatus for locating magnetizable material (5, 6) within a structure (4) includes a scanning head (1) with a permanent magnet (28) for producing a magnetic field in the structure (4). Two field plates (30, 31), adjacent one another on only one pole face of the permanent magnet (28), are interconnected by a differential circuit and measure the magnetic field of the magnet disturbed by the magnetizable material (5, 6). The differential values measured by the pair of field plates form a differential measured signal for establishing, after differentiation, the location of the magnetizable material (5, 6) within the structure (4). The location of the magnetizable material (5, 6) within the structure can be shown on a monitor (7) of an evaluation unit (3).
|
