发明名称 ABNORMALITY GENERATION TIME ESTIMATION DEVICE
摘要 PURPOSE:To fully reduce an estimation error in estimating an abnormality generation time. CONSTITUTION:The amount of process inside a plant 1 is measured by a sensor 1-1, is converted to digital values and is collected by a data collector 2, and is transmitted to a diagnosis device 3, an inverse simulator 4, and a recorder 5. The cause of an abnormality is diagnosed by a diagnosis device 3 according to the fluctuation of the amount of process, a current time and the amount of process are set as initial values by the inverse simulator 4, and then the amount of process is simulated in inverse direction regarding time using a numeric expression model corresponding to the cause. A generation time estimation device 6 calculates the deviation between the simulation result and the recorded value of the amount of past process in the recorder 5 at each sampling time, determines the a time when the deviation exceeds a set limit value to be an abnormality generation time, and then displays it on a display 7.
申请公布号 JPH0674874(A) 申请公布日期 1994.03.18
申请号 JP19920225987 申请日期 1992.08.25
申请人 MITSUBISHI HEAVY IND LTD 发明人 MARUYAMA HITOTSUGU;KAWAHARA KENICHI;HIRAMATSU TAKASHI
分类号 G01D21/00;G01M99/00;G05B23/02;G06F19/00;G21C17/00 主分类号 G01D21/00
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