SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND TESTING METHOD THEREFOR,申请号JP19920231033-传众专利搜索

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发明名称	SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND TESTING METHOD THEREFOR
摘要
申请公布号	JPH0675022(A)	申请公布日期	1994.03.18
申请号	JP19920231033	申请日期	1992.08.31
申请人	FUJITSU LTD	发明人	SHIMIZU HIROSHI
分类号	G01R31/28;G11C11/401;G11C11/407;G11C29/00;G11C29/56;H01L21/66;H01L21/82;H01L21/822;H01L27/04;(IPC1-7):G01R31/28	主分类号	G01R31/28
代理机构		代理人
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