TEST JIG FOR INTEGRATED CIRCUIT,申请号JP19920229073-传众专利搜索

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发明名称	TEST JIG FOR INTEGRATED CIRCUIT
摘要
申请公布号	JPH0675008(A)	申请公布日期	1994.03.18
申请号	JP19920229073	申请日期	1992.08.28
申请人	NEC CORP	发明人	INOSE HIROSHI;SEKINE HISAO
分类号	G01R31/26;G01R31/28;H01L23/32;(IPC1-7):G01R31/26	主分类号	G01R31/26
代理机构		代理人
主权项
地址

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