发明名称 DEFECT CORRECTION POSITION DETECTING METHOD AND DEFECT CORRECTING METHOD FOR LOGIC CIRCUIT
摘要 PURPOSE:To sufficiently narrow down and to detect defect correction positions by deciding whether a signal line satisfies external specifications by the change of the logic function or not and detecting the signal line, which satisfies them by the change of the logical function, as a defect correction position. CONSTITUTION:A defect correcting program 600 repeats a correction candidate function constitution processing 700 and an inclusion decision processing 800 for each of signal lines and pairs of logic functions SG0 and SG1 registered in a correction signal line list 233. That is, the correction candidate function constitution processing 700 changes a logical circuit 201 so that logical functions realized by a pertinent signal line are changed, thus constituting a correction candidate function 235 of this signal line. The inclusion decision processing 800 decides whether the correction candidate function 235 satisfies internal function specifications expressed by the pair of logic functions SG0 and SG1 registered in the correction signal line list 233 or not; and if it satisfies them, the circuit change executed by the correction candidate function constitution processing 700 is provided as a correction example.
申请公布号 JPH0676017(A) 申请公布日期 1994.03.18
申请号 JP19920348330 申请日期 1992.12.28
申请人 HITACHI LTD 发明人 ITO MASAKI
分类号 G06F11/22;G06F17/50 主分类号 G06F11/22
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